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Tran Van Phuc

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Featured publications

Investigations of chemical and atomic composition of native oxide layers covering SI GaAs implanted with Xe ions9 citations
Surface and Coatings Technology · 2020 · DOI
Investigations of elemental depth distribution and chemical compositions in the TiO2/SiO2/Si structures after ion irradiation6 citations
Surface and Coatings Technology · 2020 · DOI
An examination on the porosity of Er F3 doped Ca F2 crystal using the Rutherford back-scattering method3 citations
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2023 · DOI
Variation of TiO2/SiO2 mixed layers induced by Xe+ ion irradiation with energies from 100 to 250 keV2 citations
Materials Science and Engineering B · 2021 · DOI
Study of Elemental Depth Distribution in the Multilayer Material \(\text{TiO}_2\)/\(\text{SiO}_2\)/Si by Rutherford Backscattering Spectrometry (RBS)1 citations
Communications in Physics · 2019 · DOI
Pseudo-dielectric function spectra of the near surface layer of GaAs implanted with various fluence of Xe+ ions1 citations
Thin Solid Films · 2022 · DOI
Variation of TiO2/SiO2 mixed layers induced by different Xe+ ion energies
arXiv (Cornell University) · 2020 · DOI

About the field of Physics

Common research topics in this field:

Graphene research and applicationsQuantum Dots Synthesis And Properties2D Materials and ApplicationsPhotonic and Optical DevicesOptical Network TechnologiesChalcogenide Semiconductor Thin Films

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Tran Van PhucVietnam Academy of Science and Technology
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