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Chuck Le

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Featured publications

Fully aligned via integration for extendibility of interconnects to beyond the 7 nm node20 citations
· 2017 · DOI
Photodegradation of diclofenac in aqueous media via a HO˙ radical pathway using CeO 2 /g-C 3 N 4 heterojunction under visible light: experimental and computational insights7 citations
RSC Advances · 2025 · DOI
Reliability Investigation of NiPtSi Electrical Fuse With Different Programming Mechanisms6 citations
IEEE Transactions on Device and Materials Reliability · 2008 · DOI
Process Challenges in Fully Aligned Via Integration for sub 32 nm Pitch BEOL1 citations
· 2018 · DOI
Leveraging App Technologies to Boost Patient Engagement.
PubMed · 2022
Electrical Probing Role in 14nm SOI Microprocessor Failure Analysis
Proceedings - International Symposium for Testing and Failure Analysis · 2020 · DOI
Fully Aligned Via Integration for beyond 7 nm
Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials · 2018 · DOI
Author response for "Photodegradation of diclofenac in aqueous media via a HO˙ radical pathway using CeO2/g-C3N4 heterojunction under visible light: experimental and computational insights"
· 2025 · DOI
Reliability Investigation of NiPtSi Electrical Fuse with Different Programming Mechanisms
IEEE Transactions on Device and Materials Reliability · 2009 · DOI

About the field of Electronics

Common research topics in this field:

Energy Harvesting in Wireless NetworksAntenna Design and AnalysisAdvanced MIMO Systems OptimizationAdvanced Wireless Communication TechnologiesEnergy Efficient Wireless Sensor NetworksAdvanced Wireless Communication Techniques

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Chuck LeVNU University of Science
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