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Van Pham

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Featured publications

The effect of low-k ILD on the electromigration reliability of Cu interconnects with different line lengths29 citations
· 2003 · DOI
Interpretation of Resistance Changes during Interconnect Reliability Testing24 citations
MRS Proceedings · 1994 · DOI
A via failure mode in electromigration of multilevel interconnect5 citations
· 2002 · DOI
Wheatstone bridge method for electromigration study of solder balls in flip-chip packages5 citations
· 2003 · DOI
Effect of TiN ARC on Electromigration Performance of Tungsten Plug Via2 citations
MRS Proceedings · 1994 · DOI
Isothermal test as a WLR monitor for Cu interconnects2 citations
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · DOI
Sense of Femininity in Ho Xuan Huong’s Poetry1 citations
OALib · 2022 · DOI
Using Atomic Layer Deposition Method to Create Antireflective Coatings1 citations
Lecture notes in mechanical engineering · 2024 · DOI
WHEATS~~NE BRIDGE METHOD FOR ELECTROMIFKATION STUDY OF SOLDER BALLS M FLIP-CHIP PACKAGES
· 2003
Simulation of High-Power Fiber Lasers Used in Advanced Metal Cutting Machines
Lecture notes in mechanical engineering · 2025 · DOI

About the field of Electronics

Common research topics in this field:

Energy Harvesting in Wireless NetworksAntenna Design and AnalysisAdvanced MIMO Systems OptimizationAdvanced Wireless Communication TechnologiesEnergy Efficient Wireless Sensor NetworksAdvanced Wireless Communication Techniques

Institutions with the most researchers in this field:

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The publication list above is compiled from the open academic database OpenAlex (CC0 licence). Compare with the source record on OpenAlex ↗

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Van PhamNha Trang University
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